Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing

Product Description

Micron-grade Conductive Pioneer Nickel-plated Custom Tungsten Carbide Needle

The precision probe with electroplated nickel layer, with ultra-low contact resistance of 0.02Ω and HV500 hardness coating, overcomes the wear and oxidation pain points of ordinary gold-plated needles, and achieves zero-attenuation transmission of microampere-level signals in the fields of semiconductor testing and medical electrodes.

Spec-matrix:

Note: The above data is for reference only, please contact us for customization.

Performance Advantages:

- Contact Resistance: 0.02-0.05Ω (90% lower than stainless steel pins)
- Wear Life: >1,000,000 plug-in/plug cycles
- Corrosion Resistance: Passed 96h salt spray test

Application:

Semiconductor Testing
- Wafer-Level Probe Card (0.1mm Φ Microneedle Array)
- BGA Package Testing (50μm Pitch Continuity)
- Third-Generation GaN Semiconductor Device Testing (High Temperature Resistance up to 400°C)

Medical Electronics
- Implantable Neural Electrodes (Biocompatibility Certified)
- Blood Glucose Monitor Probes (Resistant to Antibody Corrosion)
- Endoscope Contacts (>500 Sterilization Cycles)

Precision Industry
- PCB Flying Probe Testing (0.3mm Continuity)
- New Energy Battery Probes (Resistant to Electrolyte Corrosion)
- Micro Connectors (Insertion and Removal Force ≤0.5N)